Critus XRD | Diffraction with Electric Field

Enabling Structural Science During the Application of Electric Fields

The patented measurement cells developed by Critus allow you to record x-ray diffraction data in your existing instrumentation while applying electric fields and simultaneously collecting macroscopic electrical and electro-mechanical response of samples.

Products

Cell 2 : X-Ray Transmission Geometry for Bulk Materials

Suitable for higher energy x-ray sources commonly available at synchrotron sources
Also possible on laboratory based x-ray diffractometers with higher energy tube (such as Ag or Mo source)
Strain and polarisation measurements in situ
Applied voltages to +/- 7.5 kV with sample oil bath
Sample thicknesses of 0.1 mm to 4 mm
Temperature from RT - 200°C
Scattering angles up to 45° allowing high-q data acquisition for in situ Pair Distribution Function analysis
Ultra-compact system design for maximum portability and integration to existing instruments

+ Learn More

Cell 3 : Thin Film Measurement System

Suitable for many laboratory and synchrotron x-ray sources
Position probe tips over full area of sample stage
Polarisation hysteresis
I-V measurements
Temperature Range from RT - 300°C
Full scattering angle range available, including grazing incidence
Ultra-compact system design for maximum portability and integration to existing instruments

+ Learn More

Cell 1 : X-Ray Reflection Geometry for Bulk Materials

Suitable for most laboratory based x-ray diffractometers and synchrotron sources
Static diffraction surface position during field application avoids peak shift artefacts
Strain and polarisation measurements in situ
Applied voltages +/- 5kV
Sample thicknesses of 0.1 mm to 2 mm, and diameters of 7 mm to 12 mm
Temperature from RT - 200°C
Large scattering angle range, including grazing incidence angles
Ultra-compact system design for maximum portability and integration to existing instruments

+ Learn More