Enabling Structural Science During the Application of Electric Fields
The patented measurement cells developed by Critus allow you to record x-ray diffraction data in your existing instrumentation while applying electric fields and simultaneously collecting macroscopic electrical and electro-mechanical response of samples.
Products
Cell 2 : X-Ray Transmission Geometry for Bulk Materials
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Suitable for higher energy x-ray sources commonly available at synchrotron sources
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Also possible on laboratory based x-ray diffractometers with higher energy tube (such as Ag or Mo source)
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Strain and polarisation measurements in situ
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Applied voltages to +/- 7.5 kV with sample oil bath
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Sample thicknesses of 0.1 mm to 4 mm
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Temperature from RT - 200°C
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Scattering angles up to 45° allowing high-q data acquisition for in situ Pair Distribution Function analysis
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Ultra-compact system design for maximum portability and integration to existing instruments
Cell 3 : Thin Film Measurement System
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Suitable for many laboratory and synchrotron x-ray sources
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Position probe tips over full area of sample stage
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Polarisation hysteresis
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I-V measurements
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Temperature Range from RT - 300°C
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Full scattering angle range available, including grazing incidence
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Ultra-compact system design for maximum portability and integration to existing instruments
Cell 1 : X-Ray Reflection Geometry for Bulk Materials
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Suitable for most laboratory based x-ray diffractometers and synchrotron sources
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Static diffraction surface position during field application avoids peak shift artefacts
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Strain and polarisation measurements in situ
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Applied voltages +/- 5kV
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Sample thicknesses of 0.1 mm to 2 mm, and diameters of 7 mm to 12 mm
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Temperature from RT - 200°C
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Large scattering angle range, including grazing incidence angles
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Ultra-compact system design for maximum portability and integration to existing instruments
