Bulk Transmission Geometry
– 1 minute to read
Description
Specifications
- Suitable for higher energy x-ray sources commonly available at synchrotron facilities or in Ag or Mo laboratory systems.
- Mechanical strain and electrical polarisation measurements in situ.
- Applied voltages ±7.5 kV,
- The recommended amplifier is the Trek 10/10B-HS, although custom cabling for alternative amplifiers can be provided upon request.
- Silicon oil bath for achieving high fields.
- Sample dimensions of up to 4 x 4 x 10 mm . Optimal sample sizes depend on x-ray beam energy and geometry. Silicon bath options for ceramic or single crystal measurements.
- Temperature range from room temperature to 200°C.
- Large scattering angle range in two tilt directions, allowing for advanced techniques such as,
- High-q scattering for Pair Distribution Function analysis of materials.
- Large volume reciprocal space mapping on single crystals.
- Compact system design for maximum portability and versatility.
- Interlock system for voltage application only when cell is closed.
Related Products
The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.
The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.
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Related Products
The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.
The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.