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Thin Film Measurements

A probe station in a form factor for mounting to a variety of XRD instrumentation. Suitable for most laboratory based x-ray diffractometers and synchrotron sources.

For example*: Bruker D8, Rigaku SmartLab, Pan​Analytical Empyrean and X'Pert

Specifications

  • Suitable for most laboratory based x-ray diffractometers and synchrotron sources

    • For example*: Bruker D8, Rigaku SmartLab, Pan​Analytical Empyrean and X'Pert

    • Depending on feature size of interest, x-ray beam focusing options may be required

  • Polarisation and I-V curve measurements in situ

  • Applied voltages +/- 27.5 V

  • Sample diameters up to 15 mm with probe tip positioning over full area

  • Sample/substrate thicknesses up to 4 mm

  • Temperature range from room temperature to 300°C

  • Large scattering angle range, including grazing incidence angles for reflectivity measurements

  • Compact system design for maximum portability and versatility

*Instruments for suitable use depend on configurations.  Please discuss with our contact staff to understand if your system is suitable.

Full System

Critus electric field cells are designed for optimal portability.  The entire Thin Film Measurement  system is packaged into a single head unit for incorporating into existing XRD equipment and a control unit.  

Operation Demonstration

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Email: enquiries@critus.com.au

 

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