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© 2019 Critus Pty. Ltd.

Thin Film Measurements

A probe station in a form factor for mounting to a variety of XRD instrumentation. Suitable for most laboratory based x-ray diffractometers and synchrotron sources.

For example*: Bruker D8, Rigaku SmartLab, Pan​Analytical Empyrean and X'Pert

Specifications

  • Suitable for most laboratory based x-ray diffractometers and synchrotron sources

    • For example*: Bruker D8, Rigaku SmartLab, Pan​Analytical Empyrean and X'Pert

    • Depending on feature size of interest, x-ray beam focusing options may be required

  • Polarisation and I-V curve measurements in situ

  • Applied voltages +/- 27.5 V

  • Sample diameters up to 15 mm with probe tip positioning over full area

  • Sample/substrate thicknesses up to 4 mm

  • Temperature range from room temperature to 300°C

  • Large scattering angle range, including grazing incidence angles for reflectivity measurements

  • Compact system design for maximum portability and versatility

*Instruments for suitable use depend on configurations.  Please discuss with our contact staff to understand if your system is suitable.

Full System

Operation Demonstration