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Diffraction Measurements with Electric Fields

Critus diffraction cells are designed to be used in a range of different ways.  There primary purpose is for use in conjunction with lab-based or synchrotron XRD instrumentation.  In this application, studies can vary from simply taking diffraction patterns at a set temperature and electric field, to full hardware synchronised time-resolved measurements.  While not being used for diffraction measurements, Critus cells also operate as stand-alone electrical and electro-mechanical property measurement systems, providing a compact and user friendly test instrument for materials scientists.

In situ diffraction data tells us about the structural response of a material to an applied electric field.  For example, there are several known mechanisms by which piezoelectric materials respond at different points in the polarisation and strain hysteresis, including lattice strain, domain volume fraction changes and phase transformations.  All of these mechanisms are resolvable using diffraction measurements.  

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